Multilayer ceramic varistors with high thermal radiation performance for superior reliability against surges

Effect of thermal radiation on reliability is investigated for ZnO-based multilayer ceramic varistors (MLCVs). Withstanding capabilities against load dump surge (LDS) are compared between MLCVs with connecting structure various-sized chips (co-MLCVs) and large size ones (5.7 × 5.0 3.0 mm). The LDS stability improved surface area co-MLCVs. In particular, when connected under 3.2 2.5 1.6 mm in size, co-MLCVs have more 30 % higher withstanding voltage (>100 V) current (>53 A) than those conventional MLCVs, despite the same electrode nonlinear V-I characteristics. results simulations show that heat dissipation due to an expansion a decrease chip size. Thus, this notable enhancement should be caused by increase radiation. And more, capability independent variation coefficient V1mA (e.g., as σ/x < 0.032). It evident improvement performance gives significant MLCVs. high certainly leads further advance high-energy surge.